SYSTEM AND METHOD FOR INSPECTING A ONE CHIP MICROPROCESSOR CIRCUIT DEVICE OF POWER PLANT PCB

PURPOSE: A system and a method for inspecting a semiconductor integrated circuit of a power plant PCB are provided to prevent the unexpected operation stop of a power plant. CONSTITUTION: A system for inspecting a semiconductor integrated circuit of a power plant PCB comprises a manipulation unit(10...

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Bibliographische Detailangaben
Hauptverfasser: YOON, DONG KIL, LEE, JI HOON, CHOI, BYOUNG YOON
Format: Patent
Sprache:eng ; kor
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Beschreibung
Zusammenfassung:PURPOSE: A system and a method for inspecting a semiconductor integrated circuit of a power plant PCB are provided to prevent the unexpected operation stop of a power plant. CONSTITUTION: A system for inspecting a semiconductor integrated circuit of a power plant PCB comprises a manipulation unit(10), a jig(20), a reading unit(40), a control unit(50), a memory unit(60), and a display unit(70). Conditions for inspecting a semiconductor IC are inputted to the manipulation unit. The jig detects data inputted and outputted through a lead pin. The reading unit reads the detected data and supplies the read data to the control unit. The control unit compares the supplied data with the normal I/O data of the semiconductor IC. The memory unit creates a new database using the data. The display unit outputs the inspection state and results of the semiconductor IC.