LIGHT EMITTING DIODE INSPECTION APPARATUS FOR BACK LIGHT

PURPOSE: An LED inspection apparatus for a backlight is provided to reduce the turn around time of a test process by performing a text process. CONSTITUTION: A main body(10) is formed in an inspection room including a first inspection area and a second inspection area. An entry transport unit suppli...

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Bibliographische Detailangaben
Hauptverfasser:	HAN, CHUNG HEE, KIM, KI YOUNG
Format:	Patent
Sprache:	eng ; kor
Schlagworte:	DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING FREQUENCY-CHANGING NON-LINEAR OPTICS OPTICAL ANALOGUE/DIGITAL CONVERTERS OPTICAL LOGIC ELEMENTS OPTICS PHYSICS TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF
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Beschreibung
Zusammenfassung:	PURPOSE: An LED inspection apparatus for a backlight is provided to reduce the turn around time of a test process by performing a text process. CONSTITUTION: A main body(10) is formed in an inspection room including a first inspection area and a second inspection area. An entry transport unit supplies driving force for entering a modulized unit. A first transport jig(40) moves a first inspection area. A second transport jig moves a second inspection area.