AN EXECUTABLE STORAGE DEVICE OF SEMICONDUCTOR CAPABLE TO OPTIMIZE A REALTIME BASE AND METHOD OF APPLICATION THE SAME

A storage medium executed by a computer for testing a semiconductor device and a method for testing the device using the same are provided to minimize underkill and overkill by automatically reflecting characteristic change of the device in an electric test program. A sampling test of a semiconducto...

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Bibliographische Detailangaben

Hauptverfasser:	CHO, SE RAE, SHIN, KYEONG SEON, CHUNG, AE YONG, LEE, HWA CHEOL
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY INFORMATION STORAGE MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES STATIC STORES TESTING
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