AN EXECUTABLE STORAGE DEVICE OF SEMICONDUCTOR CAPABLE TO OPTIMIZE A REALTIME BASE AND METHOD OF APPLICATION THE SAME

A storage medium executed by a computer for testing a semiconductor device and a method for testing the device using the same are provided to minimize underkill and overkill by automatically reflecting characteristic change of the device in an electric test program. A sampling test of a semiconductor device is executed by using an integrated test program(S200). A defective per test item is calculated from the sampling test(S300). The defective is compared with a reference data(S400), and test items are omitted or added according to the comparing result to determine a test item to be tested in a specific testing process. A test order file of a production test program is generated based on the determined test item(S600). The above steps are repeated.