METHOD AND APPARATUS FOR INSPECTING DISPLAY PANEL

A method and an apparatus for inspecting a display panel are provided to make it possible to compute position information of a defect, which is generated on a display panel, accurately. A pattern applying unit(10) applies at least one of a defect detecting pattern and a strip pattern to a display pa...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	HEO, YOUNG, KIM, JOUNG HAG, KIM, SUNG CHAI, BYOUN, SEUNG GUN, SUH, JE WAN
Format:	Patent
Sprache:	eng
Schlagworte:	DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING FREQUENCY-CHANGING NON-LINEAR OPTICS OPTICAL ANALOGUE/DIGITAL CONVERTERS OPTICAL LOGIC ELEMENTS OPTICS PHYSICS TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF
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