METHOD AND APPARATUS FOR INSPECTING DISPLAY PANEL

A method and an apparatus for inspecting a display panel are provided to make it possible to compute position information of a defect, which is generated on a display panel, accurately. A pattern applying unit(10) applies at least one of a defect detecting pattern and a strip pattern to a display pa...

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Bibliographische Detailangaben
Hauptverfasser:	HEO, YOUNG, KIM, JOUNG HAG, KIM, SUNG CHAI, BYOUN, SEUNG GUN, SUH, JE WAN
Format:	Patent
Sprache:	eng
Schlagworte:	DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING FREQUENCY-CHANGING NON-LINEAR OPTICS OPTICAL ANALOGUE/DIGITAL CONVERTERS OPTICAL LOGIC ELEMENTS OPTICS PHYSICS TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF
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Beschreibung
Zusammenfassung:	A method and an apparatus for inspecting a display panel are provided to make it possible to compute position information of a defect, which is generated on a display panel, accurately. A pattern applying unit(10) applies at least one of a defect detecting pattern and a strip pattern to a display panel(100). The defect detecting pattern is formed to inspect a defect of the display panel, and the strip pattern is formed to extract position information of a black matrix. A photographing unit(20) photographs an image of the display panel. An image processing unit(30) processes the photographed image to read defect information of the display panel and position information of the black matrix. A controlling unit(50) compares the defect information of the display panel with the position information of the black matrix, thereby computing position information of the defect.