DYNAMIC TIMING REFERENCE ALIGNMENT SYSTEM

Disclosed is a test system and a method for providing a timing function that dynamically calculates and adjusts the phase delay between an internal timing reference and an externally derived signal. This is accomplished by providing a timing generator for providing a master timing reference signal,...

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Bibliographische Detailangaben
1. Verfasser: MYDILL, MARC R
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:Disclosed is a test system and a method for providing a timing function that dynamically calculates and adjusts the phase delay between an internal timing reference and an externally derived signal. This is accomplished by providing a timing generator for providing a master timing reference signal, first, second and third counters preset at the beginning of each test cycle to each provide a count responsive to the timing reference signal, first and second multiplexers, each associated with one of the first and second counters, and first and second comparators for comparing the contents of each of the first and second multiplexers with the count of an associated counter and producing a timing edge when a count match occurs.