IC TESTING DEVICE

PURPOSE:To eliminate the conveying mechanism of a pressing device and to simplify the structure by pressing down a pressure jig with a couple of levers according to horizontal sliding. CONSTITUTION:This IC testing device is equipped with the couple of levers 21 which are arranged opposite both sides...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	FURUSHIMA TAKENARI, TERAUCHI TSUNEO
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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Beschreibung
Zusammenfassung:	PURPOSE:To eliminate the conveying mechanism of a pressing device and to simplify the structure by pressing down a pressure jig with a couple of levers according to horizontal sliding. CONSTITUTION:This IC testing device is equipped with the couple of levers 21 which are arranged opposite both sides of the pressure jig 18 slidably in the horizontal direction and press the pressure jig 18 according to the horizontal sliding, a cylinder 22 which drives at least either of the levers 21 horizontally, a couple of racks 54 which are mounted on the levers 21 in their sliding direction, and a gear 56 which engages the couple of racks 54 and synchronizes the horizontal sliding of the levers 21 through the racks 54. Then the pressure jig 18 is arranged above an IC arranged in a text box 20 and the cylinder 22 is put in operation to drive the levers 21 where the racks 54 are mounted synchronously through the engagement between the racks 54 and gear 56, thereby pressing the pressure jig 18 uniformly from right and left.