APPARATUS FOR CONTROLLING POSTURE OF PROBE
PURPOSE:To shorten a flaw detection time, by providing a servo mechanism fixedly mounting a plurality of displacement sensors each detecting the distance up to a material to be inspected on a probe and keeping the posture of the probe to the material to be inspected constant in accordance with the o...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | PURPOSE:To shorten a flaw detection time, by providing a servo mechanism fixedly mounting a plurality of displacement sensors each detecting the distance up to a material to be inspected on a probe and keeping the posture of the probe to the material to be inspected constant in accordance with the outputs of the displacement sensors. CONSTITUTION:A turntable 2 is provided in a water immersion tank 1 and the material 4 to be inspected placed thereon is rotationally controlled and, further, displacement sensors S1, S2 and a servo mechanism are provided. This servo mechanism is constituted so that the x-axis direction position and theta-axis angle-of-rotation of the probe 3 are respectively controlled in accordance with the outputs of the sensors S1, S2 provided to both side parts of the probe 3 in an x-axis direction by an x-axis moving motor 13 and a theta-axis rotary motor 16 through an x-axis moving part 12 and an theta-axis rotary part 15. The probe 3 controls a z-axis direction position by an x-axis moving motor 19 through a z-axis moving rod 18. Therefore, the degree of freedom of an x-axis, z-axis and a theta-axis is given to the probe 3 and the respective axes are indivisually controlled by the servo mechanism. |
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