JPS6332863B
PURPOSE:To prepare the titled film having excellent photo-conductitity, at high speed, by introducing a monosilane gas into a vacuum chamber, and applying direct electrical field keeping partial pressure of gas, flow of gas, direct electrical power density, and the substrate temperature, at specific...
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creator | KAWAJIRI KAZUHIRO MIZOBUCHI JUZO AZUMA AKIO |
description | PURPOSE:To prepare the titled film having excellent photo-conductitity, at high speed, by introducing a monosilane gas into a vacuum chamber, and applying direct electrical field keeping partial pressure of gas, flow of gas, direct electrical power density, and the substrate temperature, at specific levels, thereby generating electrical discharge. CONSTITUTION:An amorphous silicon film is prepared by the direct glow discharge decomposition of monosilane gas which comprises the introduction of the monosilane gas into the vacuum chamber and application of direct electrical field to cause the electrical discharge. In the above process, the amorphous silicon film can be deposited at a rate of >=20Angstrom /sec, by keeping the monosilane gas partial pressure at 0.2-1.0 Torr, the flow of the monosilane gas at 0.01-2.0cc/min per 1cm of the space between the electrodes, the direct electrical power density imposed to the cathode mounted with the substrate at 0.1-1.0W/cm , and the substrate temperature at 250-450 deg.C. The process increases the rate of deposition, suppresses the increase of defects accompanied to the high-speed deposition, and gives an amorphous silicon film having excellent photoconductivity at a reduced production cost. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JPS6332863BB2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JPS6332863BB2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JPS6332863BB23</originalsourceid><addsrcrecordid>eNrjZOD2Cgg2MzY2sjAzduJhYE1LzClO5YXS3AxKbq4hzh66qQX58anFBYnJqXmpJfFIOpyMjIlSBACFChxy</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>JPS6332863B</title><source>esp@cenet</source><creator>KAWAJIRI KAZUHIRO ; MIZOBUCHI JUZO ; AZUMA AKIO</creator><creatorcontrib>KAWAJIRI KAZUHIRO ; MIZOBUCHI JUZO ; AZUMA AKIO</creatorcontrib><description>PURPOSE:To prepare the titled film having excellent photo-conductitity, at high speed, by introducing a monosilane gas into a vacuum chamber, and applying direct electrical field keeping partial pressure of gas, flow of gas, direct electrical power density, and the substrate temperature, at specific levels, thereby generating electrical discharge. CONSTITUTION:An amorphous silicon film is prepared by the direct glow discharge decomposition of monosilane gas which comprises the introduction of the monosilane gas into the vacuum chamber and application of direct electrical field to cause the electrical discharge. In the above process, the amorphous silicon film can be deposited at a rate of >=20Angstrom /sec, by keeping the monosilane gas partial pressure at 0.2-1.0 Torr, the flow of the monosilane gas at 0.01-2.0cc/min per 1cm of the space between the electrodes, the direct electrical power density imposed to the cathode mounted with the substrate at 0.1-1.0W/cm , and the substrate temperature at 250-450 deg.C. The process increases the rate of deposition, suppresses the increase of defects accompanied to the high-speed deposition, and gives an amorphous silicon film having excellent photoconductivity at a reduced production cost.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; CHEMICAL SURFACE TREATMENT ; CHEMISTRY ; CINEMATOGRAPHY ; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL ; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL ; COATING MATERIAL WITH METALLIC MATERIAL ; COATING METALLIC MATERIAL ; DIFFUSION TREATMENT OF METALLIC MATERIAL ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; ELECTROGRAPHY ; ELECTROPHOTOGRAPHY ; HOLOGRAPHY ; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL ; MAGNETOGRAPHY ; METALLURGY ; PHOTOGRAPHY ; PHYSICS ; SEMICONDUCTOR DEVICES ; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</subject><creationdate>1988</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19880701&DB=EPODOC&CC=JP&NR=S6332863B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19880701&DB=EPODOC&CC=JP&NR=S6332863B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KAWAJIRI KAZUHIRO</creatorcontrib><creatorcontrib>MIZOBUCHI JUZO</creatorcontrib><creatorcontrib>AZUMA AKIO</creatorcontrib><title>JPS6332863B</title><description>PURPOSE:To prepare the titled film having excellent photo-conductitity, at high speed, by introducing a monosilane gas into a vacuum chamber, and applying direct electrical field keeping partial pressure of gas, flow of gas, direct electrical power density, and the substrate temperature, at specific levels, thereby generating electrical discharge. CONSTITUTION:An amorphous silicon film is prepared by the direct glow discharge decomposition of monosilane gas which comprises the introduction of the monosilane gas into the vacuum chamber and application of direct electrical field to cause the electrical discharge. In the above process, the amorphous silicon film can be deposited at a rate of >=20Angstrom /sec, by keeping the monosilane gas partial pressure at 0.2-1.0 Torr, the flow of the monosilane gas at 0.01-2.0cc/min per 1cm of the space between the electrodes, the direct electrical power density imposed to the cathode mounted with the substrate at 0.1-1.0W/cm , and the substrate temperature at 250-450 deg.C. The process increases the rate of deposition, suppresses the increase of defects accompanied to the high-speed deposition, and gives an amorphous silicon film having excellent photoconductivity at a reduced production cost.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CHEMICAL SURFACE TREATMENT</subject><subject>CHEMISTRY</subject><subject>CINEMATOGRAPHY</subject><subject>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</subject><subject>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</subject><subject>COATING MATERIAL WITH METALLIC MATERIAL</subject><subject>COATING METALLIC MATERIAL</subject><subject>DIFFUSION TREATMENT OF METALLIC MATERIAL</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>ELECTROGRAPHY</subject><subject>ELECTROPHOTOGRAPHY</subject><subject>HOLOGRAPHY</subject><subject>INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL</subject><subject>MAGNETOGRAPHY</subject><subject>METALLURGY</subject><subject>PHOTOGRAPHY</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1988</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZOD2Cgg2MzY2sjAzduJhYE1LzClO5YXS3AxKbq4hzh66qQX58anFBYnJqXmpJfFIOpyMjIlSBACFChxy</recordid><startdate>19880701</startdate><enddate>19880701</enddate><creator>KAWAJIRI KAZUHIRO</creator><creator>MIZOBUCHI JUZO</creator><creator>AZUMA AKIO</creator><scope>EVB</scope></search><sort><creationdate>19880701</creationdate><title>JPS6332863B</title><author>KAWAJIRI KAZUHIRO ; MIZOBUCHI JUZO ; AZUMA AKIO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPS6332863BB23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1988</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CHEMICAL SURFACE TREATMENT</topic><topic>CHEMISTRY</topic><topic>CINEMATOGRAPHY</topic><topic>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</topic><topic>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</topic><topic>COATING MATERIAL WITH METALLIC MATERIAL</topic><topic>COATING METALLIC MATERIAL</topic><topic>DIFFUSION TREATMENT OF METALLIC MATERIAL</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>ELECTROGRAPHY</topic><topic>ELECTROPHOTOGRAPHY</topic><topic>HOLOGRAPHY</topic><topic>INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL</topic><topic>MAGNETOGRAPHY</topic><topic>METALLURGY</topic><topic>PHOTOGRAPHY</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</topic><toplevel>online_resources</toplevel><creatorcontrib>KAWAJIRI KAZUHIRO</creatorcontrib><creatorcontrib>MIZOBUCHI JUZO</creatorcontrib><creatorcontrib>AZUMA AKIO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KAWAJIRI KAZUHIRO</au><au>MIZOBUCHI JUZO</au><au>AZUMA AKIO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>JPS6332863B</title><date>1988-07-01</date><risdate>1988</risdate><abstract>PURPOSE:To prepare the titled film having excellent photo-conductitity, at high speed, by introducing a monosilane gas into a vacuum chamber, and applying direct electrical field keeping partial pressure of gas, flow of gas, direct electrical power density, and the substrate temperature, at specific levels, thereby generating electrical discharge. CONSTITUTION:An amorphous silicon film is prepared by the direct glow discharge decomposition of monosilane gas which comprises the introduction of the monosilane gas into the vacuum chamber and application of direct electrical field to cause the electrical discharge. In the above process, the amorphous silicon film can be deposited at a rate of >=20Angstrom /sec, by keeping the monosilane gas partial pressure at 0.2-1.0 Torr, the flow of the monosilane gas at 0.01-2.0cc/min per 1cm of the space between the electrodes, the direct electrical power density imposed to the cathode mounted with the substrate at 0.1-1.0W/cm , and the substrate temperature at 250-450 deg.C. The process increases the rate of deposition, suppresses the increase of defects accompanied to the high-speed deposition, and gives an amorphous silicon film having excellent photoconductivity at a reduced production cost.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRIC ELEMENTS CHEMICAL SURFACE TREATMENT CHEMISTRY CINEMATOGRAPHY COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL COATING MATERIAL WITH METALLIC MATERIAL COATING METALLIC MATERIAL DIFFUSION TREATMENT OF METALLIC MATERIAL ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY ELECTROGRAPHY ELECTROPHOTOGRAPHY HOLOGRAPHY INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL MAGNETOGRAPHY METALLURGY PHOTOGRAPHY PHYSICS SEMICONDUCTOR DEVICES SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION |
title | JPS6332863B |
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