METHOD FOR MEASURING POTENTIAL DIFFERENCE IN VAN DER PAWU METHOD

PURPOSE:To measure potential difference at ambient temp. with good accuracy, by a method wherein predetermined voltage is applied to two adjacent terminals of four terminals and voltages between one terminal, to which voltage is applied, and two residual terminals are respectively calculated and, fu...

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Bibliographische Detailangaben
Hauptverfasser:	KASHIYANAGI YUZO, ITOU YOSHITERU, NAKAMURA YOSHIO
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	PURPOSE:To measure potential difference at ambient temp. with good accuracy, by a method wherein predetermined voltage is applied to two adjacent terminals of four terminals and voltages between one terminal, to which voltage is applied, and two residual terminals are respectively calculated and, further, voltages of two terminals to which no voltage is applied are calculated. CONSTITUTION:A four-terminal network 1 has four terminals P-S. At first, a DC power source 2 is connected to two terminals P, Q and, next, in such a state that the power source 2 is connected, the voltage VRQ between the terminals R, Q and the voltage VSQ between the terminals S, Q are measured and the voltage VSR between the terminals S, R is measured by VSR=VSQ-VRQ. By this method, the voltage between two adjacent terminals can be measured at ambient temp. with good accuracy.