MEASUREMENT OF DEFORMATION PERIOD OF OBJECT WITH PERIODICALLY CHANGING CONFIGURATION

PURPOSE:To automatically measure the deformation period of an object by specifying some measuring points in a screen wherein the object whose configuration periodically changes is photographed and continuously measuring the luminance of the measuring points. CONSTITUTION:A pre-processed cell 3 which...

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Hauptverfasser: HATTORI YUKIO, NANBA TSUNEO
Format: Patent
Sprache:eng
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Zusammenfassung:PURPOSE:To automatically measure the deformation period of an object by specifying some measuring points in a screen wherein the object whose configuration periodically changes is photographed and continuously measuring the luminance of the measuring points. CONSTITUTION:A pre-processed cell 3 which is an object whose configuration periodically changes is placed on the sample stage 2 of a microscope 1, which is adjusted by suitably adjusting a position, a focus and the like while observing a monitor television 6. The same number of quartz fiber bundles 7 as that of measuring points to be measured at the same time are prepared. The quartz fiber bundles 7 are positioned so that each fiber bundle 7 can sufficiently catch change in the cell 3 and the ends of the fiber bundles 7 are fixed by a fixing jig 8. The other ends of the fiber bundles 7 are connected to an analyzer 11 into which a photomultiplier is assembled. Data caught by the analyzer 11 are converted to digital signals and stored in a personal computer 9. Further, the luminance data of the measuring points are stored by specified times or for a specified time length. The deformation period of the object can be automat ically obtained from the luminance data.