INSPECTING METHOD FOR CHARACTERISTICS OF MAGNETIC HEAD

PURPOSE:To obtain an accurate measuring value in a proper processing time by previously calculating specific factors of a quintic equation from a logical value and a measured value and storing these factors in a storage means. CONSTITUTION:A sine wave signal is inputted from a reference signal sourc...

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1. Verfasser: YONEYAMA YUKIO
Format: Patent
Sprache:eng
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Zusammenfassung:PURPOSE:To obtain an accurate measuring value in a proper processing time by previously calculating specific factors of a quintic equation from a logical value and a measured value and storing these factors in a storage means. CONSTITUTION:A sine wave signal is inputted from a reference signal source 12, a measured value at that time is recorded, and while dropping the level of the since wave signal every 1dB by attenuator 13, the measured value is recorded. An operator inputs the obtained n measured values through a keyboard 18 on a personal computer 17 to allow the microprocessor 19 to computer the factors a0-5 of a quintic equation f(x)=XG+a0+a1X+a2X +a3X +a4X +a5X and stores the factors in a disk 20. At the time of measurement, the factors a0-a5 are read out from the disk 20, an error is calculated from the measured values of a magnetic head and added to the measured value to obtain a mea sured value excluding the influence of a non-linear circuit. Consequently, the inspection can be completed within a short period and the inspected result is accurate.