INSPECTION METHOD FOR CIRCUIT BOARD

PURPOSE:To inspect many electrodes which are arrayed at narrow pitch at the same time without flawing by pressing the electrodes to be measured and a flexible measurement substrate such as a film substrate with a presser piece made of an elastic body. CONSTITUTION:The substrate 7 to be measured wher...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	HAMAUCHI CHIKAICHI, KINOSHITA HIROSHI, INAGAKI NORIYUKI, MAKINO YUTAKA
Format:	Patent
Sprache:	eng
Schlagworte:	DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING FREQUENCY-CHANGING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES NON-LINEAR OPTICS OPTICAL ANALOGUE/DIGITAL CONVERTERS OPTICAL LOGIC ELEMENTS OPTICS PHYSICS TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF TESTING
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