JPS6255099B

PURPOSE:To enable to perform an easy observation and to prevent a sample from being damaged, by a method wherein a light axis of an optical lens-system part for an optical microscope is caused to approximately coincide with an ultrasonic axis of an ultrasonic flux lens for an ultrasonic microscope....

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: UCHINO FUMIO, MOMII ISAO
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:PURPOSE:To enable to perform an easy observation and to prevent a sample from being damaged, by a method wherein a light axis of an optical lens-system part for an optical microscope is caused to approximately coincide with an ultrasonic axis of an ultrasonic flux lens for an ultrasonic microscope. CONSTITUTION:An optical lens system 12a for an optical microscope 12 is located above an ultrasonic flux lens 4 for an ultrasonic microscope, and is situated so that the light axis of the optical lens 12a is caused to previously coincide with the ultrasonic axis of the ultrasonic flux lens 4. A current ultrasonic image is obtained through the movement of the ultrasonic flux lens 4 in a Y-direction as it is vibrated in a X-direction and through the conversion of an ultrasonic wave, obtained from a sample 7, into an electric signal by means of a transducer 3. Meanwhile, the light axis of the optical lens system for the optical microscope previously coincides with the ultrasonic axis of the ultrasonic flux lens, and this permits the very easy observation of an optical image without the movement of the minute part of the sample.