PATTERN READING DEVICE FOR WAFER
PURPOSE:To realize a small-size illuminating device, by constituting with a stage to mount a wafer, a light emitting element array to illuminate a part of the wafer, the driving means to scan the illuminated part of the wafer, and an image pick-up element array. CONSTITUTION:A part of a wafer 3 moun...
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creator | AKAGAWA KATSUYUKI |
description | PURPOSE:To realize a small-size illuminating device, by constituting with a stage to mount a wafer, a light emitting element array to illuminate a part of the wafer, the driving means to scan the illuminated part of the wafer, and an image pick-up element array. CONSTITUTION:A part of a wafer 3 mounted on a stage 1 is illuminated by a scattered light (c) of a light emitting element array 4. This part is read by a image pick-up element array 6 through a lens 5. As for the image puck-up element array 6 which reads the pattern of a wafer 3, a plurality of solid state image pick-up elements are arranged in a row nearly parallel to the direction along which a plurality of solid state light emitting array 8 is arranged, so that one line of pattern of the wafer 3 is read. A driving equipment 2 moves a stage 1 in the direction nearly perpendicular to the direction along which a plurality of solid state light emitting element 8 is arranged, while the image pick-up element array 6 reads the pattern of the wafer 3 row by row. In the course of this traveling, a light emitting element array 4 illuminates the whole part of the wafer 3 so that the image pick-up element array 6 may read the whole part of the wafer 3. |
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CONSTITUTION:A part of a wafer 3 mounted on a stage 1 is illuminated by a scattered light (c) of a light emitting element array 4. This part is read by a image pick-up element array 6 through a lens 5. As for the image puck-up element array 6 which reads the pattern of a wafer 3, a plurality of solid state image pick-up elements are arranged in a row nearly parallel to the direction along which a plurality of solid state light emitting array 8 is arranged, so that one line of pattern of the wafer 3 is read. A driving equipment 2 moves a stage 1 in the direction nearly perpendicular to the direction along which a plurality of solid state light emitting element 8 is arranged, while the image pick-up element array 6 reads the pattern of the wafer 3 row by row. In the course of this traveling, a light emitting element array 4 illuminates the whole part of the wafer 3 so that the image pick-up element array 6 may read the whole part of the wafer 3.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>1987</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19870212&DB=EPODOC&CC=JP&NR=S6232624A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19870212&DB=EPODOC&CC=JP&NR=S6232624A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>AKAGAWA KATSUYUKI</creatorcontrib><title>PATTERN READING DEVICE FOR WAFER</title><description>PURPOSE:To realize a small-size illuminating device, by constituting with a stage to mount a wafer, a light emitting element array to illuminate a part of the wafer, the driving means to scan the illuminated part of the wafer, and an image pick-up element array. CONSTITUTION:A part of a wafer 3 mounted on a stage 1 is illuminated by a scattered light (c) of a light emitting element array 4. This part is read by a image pick-up element array 6 through a lens 5. As for the image puck-up element array 6 which reads the pattern of a wafer 3, a plurality of solid state image pick-up elements are arranged in a row nearly parallel to the direction along which a plurality of solid state light emitting array 8 is arranged, so that one line of pattern of the wafer 3 is read. A driving equipment 2 moves a stage 1 in the direction nearly perpendicular to the direction along which a plurality of solid state light emitting element 8 is arranged, while the image pick-up element array 6 reads the pattern of the wafer 3 row by row. In the course of this traveling, a light emitting element array 4 illuminates the whole part of the wafer 3 so that the image pick-up element array 6 may read the whole part of the wafer 3.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1987</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFAIcAwJcQ3yUwhydXTx9HNXcHEN83R2VXDzD1IId3RzDeJhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBYnJqXmpJfFeAcFmRsZGZkYmjsZEKAEAqK8hkw</recordid><startdate>19870212</startdate><enddate>19870212</enddate><creator>AKAGAWA KATSUYUKI</creator><scope>EVB</scope></search><sort><creationdate>19870212</creationdate><title>PATTERN READING DEVICE FOR WAFER</title><author>AKAGAWA KATSUYUKI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPS6232624A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1987</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>AKAGAWA KATSUYUKI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>AKAGAWA KATSUYUKI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>PATTERN READING DEVICE FOR WAFER</title><date>1987-02-12</date><risdate>1987</risdate><abstract>PURPOSE:To realize a small-size illuminating device, by constituting with a stage to mount a wafer, a light emitting element array to illuminate a part of the wafer, the driving means to scan the illuminated part of the wafer, and an image pick-up element array. CONSTITUTION:A part of a wafer 3 mounted on a stage 1 is illuminated by a scattered light (c) of a light emitting element array 4. This part is read by a image pick-up element array 6 through a lens 5. As for the image puck-up element array 6 which reads the pattern of a wafer 3, a plurality of solid state image pick-up elements are arranged in a row nearly parallel to the direction along which a plurality of solid state light emitting array 8 is arranged, so that one line of pattern of the wafer 3 is read. A driving equipment 2 moves a stage 1 in the direction nearly perpendicular to the direction along which a plurality of solid state light emitting element 8 is arranged, while the image pick-up element array 6 reads the pattern of the wafer 3 row by row. In the course of this traveling, a light emitting element array 4 illuminates the whole part of the wafer 3 so that the image pick-up element array 6 may read the whole part of the wafer 3.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS SEMICONDUCTOR DEVICES TESTING |
title | PATTERN READING DEVICE FOR WAFER |
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