RADIATION TEMPERATURE MEASURING INSTRUMENT

PURPOSE:To enable a temperature pattern and a temperature to be measured with high reliability by providing a polarizer for intercepting infrared rays other than those from an object being measured and photoelectrically converting means for receiving the output of the polarizer. CONSTITUTION:Infrare...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: ODA NAOKI, MOTOYAMA JIYUNSHIROU, IWAKAWA MASATO
Format: Patent
Sprache:eng
Schlagworte:
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Beschreibung
Zusammenfassung:PURPOSE:To enable a temperature pattern and a temperature to be measured with high reliability by providing a polarizer for intercepting infrared rays other than those from an object being measured and photoelectrically converting means for receiving the output of the polarizer. CONSTITUTION:Infrared rays 2 incident from an infrared ray incident window 1 are incident upon a polarizer 3. The polarizer 3 intercepts reflected infrared rays other than those from an object being measured. An optimum rotation angle calculating and storing unit 5 outputs rotation control signals to a rotating mechanism 4 and calculates an optimum rotational angle in advance to output it to the rotating mechanism 4. The mechanism 4 rotates the polarizer 3 through the optimum rotational angle. The infrared rays transmitted through the polarizer 3 are incident upon a horizontal direction scanning mirror 7 via a vertical direction scanning mirror 6 and scan the infrared rays from the object being measured. The infrared rays reflected from the mirror 7 are incident upon a lens 8 to be collected and incident upon a filter 9. The infrared rays transmitted through the filter 9 are, after photoelectrically converted 10 and amplified 12, processed 14 and a temperature pattern and a temperature are displayed 15.