PROBE CARD

PURPOSE:To connect probes for the power source or grounding and general probes for signal to patterns in an optimum state by a method wherein the patterns, to which the probes are connected, are each formed on the different stepped parts on a substrate. CONSTITUTION:Conductive patterns 2a and 2b are...

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Bibliographische Detailangaben
1. Verfasser:	ISHIGURO HIDEO
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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Beschreibung
Zusammenfassung:	PURPOSE:To connect probes for the power source or grounding and general probes for signal to patterns in an optimum state by a method wherein the patterns, to which the probes are connected, are each formed on the different stepped parts on a substrate. CONSTITUTION:Conductive patterns 2a and 2b are provided on the stepped parts provided on a substrate 1. The base parts of probes 3a and 3b are each connected electrically to the patterns 2a and 2b. The probes 3a are probes for the power source or grounding and the probes 3a are general probes for signal. Thereby, the connection of the probes to the patterns becomes possible in the optimum state.