PROBE POINT DECISION FOR IN-CIRCUIT TESTER

PURPOSE:To perform an action test with an in-circuit tester, by examining probe pins to determine whether the contact by each probe pin is possible to detect a point where the contact by the probe pin is possible, while tracking a print pattern when it is impossible. CONSTITUTION:Logical design information indicating logical connection relationship of electronic components 16 on a printed circuit board 15 and package design information indicating connection state of a print pattern on a printed circuit board 15 and the manner the electronic components 16 are mounted on the printed circuit board 15 are recorded on a recording means beforehand. Based on the package design information, candidate position of erecting a pin is examined to determine whether the contact by a probe pin 14 is possible or not. When it is impossible, a contact possible point by the probe pin 14 on a printed pattern which is connected to the pin erection candidate position is detected from the package design information to determined the position for erecting the probe pin 14.