RESIST COATING EQUIPMENT

PURPOSE:To form an uniform resist film, by installing wafer-temperature regulator which performs wafer-temperature regulation as a pretreatment of resist coating. CONSTITUTION:A brine-temperature regulator 11 heats or cools such that a brine temperature is made equal to a resist temperature in accor...

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Hauptverfasser: TAKAISHI YUTAKA, HIRANO HIROSHI
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creator TAKAISHI YUTAKA
HIRANO HIROSHI
description PURPOSE:To form an uniform resist film, by installing wafer-temperature regulator which performs wafer-temperature regulation as a pretreatment of resist coating. CONSTITUTION:A brine-temperature regulator 11 heats or cools such that a brine temperature is made equal to a resist temperature in accordance with the difference between the resist temperature on a resist-temperature detecting terminal 10 and the brine temperature on a brine-temperature detecting terminal 9. The temperature-regulated brine is sent into a heat exchanger 7 from a tank 15 of the brine-temperature detecting terminal by a circulation pump 12 via the inner part of a rotary shaft 14. A wafer heated by a pre-heater is fixed on the adhering surface of a heat exchanger 7 in a spin-chuck 4A, and heat exchange is performed via the adhering surface. After the surface temperature of the wafer is stabilized, resist is spouted from a nozzle 6 and the spin-chuck 4A is rotated at a high speed. A thin resist film is formed on the wafer, thereby.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JPS62205626A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JPS62205626A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JPS62205626A3</originalsourceid><addsrcrecordid>eNrjZJAIcg32DA5RcPZ3DPH0c1dwDQz1DPB19QvhYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxXgHBZkZGBqZmRmaOxsSoAQAKoCAo</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>RESIST COATING EQUIPMENT</title><source>esp@cenet</source><creator>TAKAISHI YUTAKA ; HIRANO HIROSHI</creator><creatorcontrib>TAKAISHI YUTAKA ; HIRANO HIROSHI</creatorcontrib><description>PURPOSE:To form an uniform resist film, by installing wafer-temperature regulator which performs wafer-temperature regulation as a pretreatment of resist coating. CONSTITUTION:A brine-temperature regulator 11 heats or cools such that a brine temperature is made equal to a resist temperature in accordance with the difference between the resist temperature on a resist-temperature detecting terminal 10 and the brine temperature on a brine-temperature detecting terminal 9. The temperature-regulated brine is sent into a heat exchanger 7 from a tank 15 of the brine-temperature detecting terminal by a circulation pump 12 via the inner part of a rotary shaft 14. A wafer heated by a pre-heater is fixed on the adhering surface of a heat exchanger 7 in a spin-chuck 4A, and heat exchange is performed via the adhering surface. After the surface temperature of the wafer is stabilized, resist is spouted from a nozzle 6 and the spin-chuck 4A is rotated at a high speed. A thin resist film is formed on the wafer, thereby.</description><language>eng</language><subject>APPARATUS FOR APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TOSURFACES, IN GENERAL ; APPARATUS SPECIALLY ADAPTED THEREFOR ; APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TO SURFACES, IN GENERAL ; BASIC ELECTRIC ELEMENTS ; CINEMATOGRAPHY ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; ELECTROGRAPHY ; HOLOGRAPHY ; MATERIALS THEREFOR ; ORIGINALS THEREFOR ; PERFORMING OPERATIONS ; PHOTOGRAPHY ; PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES ; PHYSICS ; SEMICONDUCTOR DEVICES ; SPRAYING OR ATOMISING IN GENERAL ; TRANSPORTING</subject><creationdate>1987</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19870910&amp;DB=EPODOC&amp;CC=JP&amp;NR=S62205626A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19870910&amp;DB=EPODOC&amp;CC=JP&amp;NR=S62205626A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TAKAISHI YUTAKA</creatorcontrib><creatorcontrib>HIRANO HIROSHI</creatorcontrib><title>RESIST COATING EQUIPMENT</title><description>PURPOSE:To form an uniform resist film, by installing wafer-temperature regulator which performs wafer-temperature regulation as a pretreatment of resist coating. CONSTITUTION:A brine-temperature regulator 11 heats or cools such that a brine temperature is made equal to a resist temperature in accordance with the difference between the resist temperature on a resist-temperature detecting terminal 10 and the brine temperature on a brine-temperature detecting terminal 9. The temperature-regulated brine is sent into a heat exchanger 7 from a tank 15 of the brine-temperature detecting terminal by a circulation pump 12 via the inner part of a rotary shaft 14. A wafer heated by a pre-heater is fixed on the adhering surface of a heat exchanger 7 in a spin-chuck 4A, and heat exchange is performed via the adhering surface. After the surface temperature of the wafer is stabilized, resist is spouted from a nozzle 6 and the spin-chuck 4A is rotated at a high speed. A thin resist film is formed on the wafer, thereby.</description><subject>APPARATUS FOR APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TOSURFACES, IN GENERAL</subject><subject>APPARATUS SPECIALLY ADAPTED THEREFOR</subject><subject>APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TO SURFACES, IN GENERAL</subject><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CINEMATOGRAPHY</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>ELECTROGRAPHY</subject><subject>HOLOGRAPHY</subject><subject>MATERIALS THEREFOR</subject><subject>ORIGINALS THEREFOR</subject><subject>PERFORMING OPERATIONS</subject><subject>PHOTOGRAPHY</subject><subject>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>SPRAYING OR ATOMISING IN GENERAL</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1987</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJAIcg32DA5RcPZ3DPH0c1dwDQz1DPB19QvhYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxXgHBZkZGBqZmRmaOxsSoAQAKoCAo</recordid><startdate>19870910</startdate><enddate>19870910</enddate><creator>TAKAISHI YUTAKA</creator><creator>HIRANO HIROSHI</creator><scope>EVB</scope></search><sort><creationdate>19870910</creationdate><title>RESIST COATING EQUIPMENT</title><author>TAKAISHI YUTAKA ; HIRANO HIROSHI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JPS62205626A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1987</creationdate><topic>APPARATUS FOR APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TOSURFACES, IN GENERAL</topic><topic>APPARATUS SPECIALLY ADAPTED THEREFOR</topic><topic>APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TO SURFACES, IN GENERAL</topic><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CINEMATOGRAPHY</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>ELECTROGRAPHY</topic><topic>HOLOGRAPHY</topic><topic>MATERIALS THEREFOR</topic><topic>ORIGINALS THEREFOR</topic><topic>PERFORMING OPERATIONS</topic><topic>PHOTOGRAPHY</topic><topic>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>SPRAYING OR ATOMISING IN GENERAL</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>TAKAISHI YUTAKA</creatorcontrib><creatorcontrib>HIRANO HIROSHI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TAKAISHI YUTAKA</au><au>HIRANO HIROSHI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>RESIST COATING EQUIPMENT</title><date>1987-09-10</date><risdate>1987</risdate><abstract>PURPOSE:To form an uniform resist film, by installing wafer-temperature regulator which performs wafer-temperature regulation as a pretreatment of resist coating. CONSTITUTION:A brine-temperature regulator 11 heats or cools such that a brine temperature is made equal to a resist temperature in accordance with the difference between the resist temperature on a resist-temperature detecting terminal 10 and the brine temperature on a brine-temperature detecting terminal 9. The temperature-regulated brine is sent into a heat exchanger 7 from a tank 15 of the brine-temperature detecting terminal by a circulation pump 12 via the inner part of a rotary shaft 14. A wafer heated by a pre-heater is fixed on the adhering surface of a heat exchanger 7 in a spin-chuck 4A, and heat exchange is performed via the adhering surface. After the surface temperature of the wafer is stabilized, resist is spouted from a nozzle 6 and the spin-chuck 4A is rotated at a high speed. A thin resist film is formed on the wafer, thereby.</abstract><oa>free_for_read</oa></addata></record>
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subjects APPARATUS FOR APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TOSURFACES, IN GENERAL
APPARATUS SPECIALLY ADAPTED THEREFOR
APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TO SURFACES, IN GENERAL
BASIC ELECTRIC ELEMENTS
CINEMATOGRAPHY
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
ELECTROGRAPHY
HOLOGRAPHY
MATERIALS THEREFOR
ORIGINALS THEREFOR
PERFORMING OPERATIONS
PHOTOGRAPHY
PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES
PHYSICS
SEMICONDUCTOR DEVICES
SPRAYING OR ATOMISING IN GENERAL
TRANSPORTING
title RESIST COATING EQUIPMENT
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-04T09%3A42%3A30IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=TAKAISHI%20YUTAKA&rft.date=1987-09-10&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJPS62205626A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true