METHOD FOR MEASURING THICKNESS

PURPOSE:To accurately detect surface unevenness, by successively calculating the integrated value per a predetermined time of the output of a radiation detector while shifting a time shorter than said time. CONSTITUTION:A scintillator 12 outputs an optical pulse signal corresponding to the quantity...

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Bibliographische Detailangaben
Hauptverfasser:	TAIRA UTARO, KAWAGUCHI KIYOHIKO
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	PURPOSE:To accurately detect surface unevenness, by successively calculating the integrated value per a predetermined time of the output of a radiation detector while shifting a time shorter than said time. CONSTITUTION:A scintillator 12 outputs an optical pulse signal corresponding to the quantity of X-rays transmitted through a steel plate S and a peak selector 14 outputs pulse signals with a definite peak or more among pulse signals outputted from the scintillator 12 and subjected to light-current conversion to five counters 21-25. The counters 21-25 count the number of the output pulses of the peak selector 14 in synchronous relation to the clock pulse emitted by an oscillator 15 and the count start timings in the counters 21-25 are shifted by one clock pulse, that is, a time T/5. The integrated values at the predetermined time T of the counters 21-25 are operated by an operator 16 to calculate the thickness of the steel plate.