JPS6113222B

X-rays or gamma -rays are detected by irradiating a beam of high energy radiation onto a crystalline bismuth oxide compound having the formula Bi10-14X1On wherein X is at least one element selected from the group consisting of Al, Ga, Ge, Si and Ti and n is a numeral substantially equal to the stoic...

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Hauptverfasser: HERUMUUTO TOOMAN, KURISUTA GURAAPUMAIYAA
Format: Patent
Sprache:eng
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Zusammenfassung:X-rays or gamma -rays are detected by irradiating a beam of high energy radiation onto a crystalline bismuth oxide compound having the formula Bi10-14X1On wherein X is at least one element selected from the group consisting of Al, Ga, Ge, Si and Ti and n is a numeral substantially equal to the stoichiometric amount of oxygen within the compound. The above bismuth oxide crystalline compound may be placed in a radiation dosimeter or be applied as a radiation-sensitive coating on a cylinder or plate of an apparatus for producing electrostatic copies (i.e., an in a xerographic process or the like). This is a division of application Ser. No. 837,197, filed Sept. 28, 1977.