METHOD OF IMAGE-FORMING SLICE OF TEST SPECIMEN

A method is provided for imaging a transverse slice of an object with reduced sensitivity to image artifacts due to object motion during the scan. The method utilizes projection measurements corresponding to at least a 180°C scan of the slice. The measurements are taken sequentially for views that a...

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Bibliographische Detailangaben
1. Verfasser: NOOBAATO JIYOSEFU PERUKU
Format: Patent
Sprache:eng
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