METHOD OF IMAGE-FORMING SLICE OF TEST SPECIMEN

A method is provided for imaging a transverse slice of an object with reduced sensitivity to image artifacts due to object motion during the scan. The method utilizes projection measurements corresponding to at least a 180°C scan of the slice. The measurements are taken sequentially for views that a...

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1. Verfasser: NOOBAATO JIYOSEFU PERUKU
Format: Patent
Sprache:eng
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Zusammenfassung:A method is provided for imaging a transverse slice of an object with reduced sensitivity to image artifacts due to object motion during the scan. The method utilizes projection measurements corresponding to at least a 180°C scan of the slice. The measurements are taken sequentially for views that are adjacent in angle such that measurements which are at the extremes of the scan angle are nevertheless measured at points close in time, reducing inconsistencies therebetween. The method is applicable to a number of modalities utilizing parallel-ray and fan-beam geometries, such as NMR and ultrasound, respectively.