LASER CONTINUOUS ANALYSIS OF METAL AND INSULATOR IN FLUIDIZED STATE

PURPOSE:To improve the analytical precision by setting the distance between a condenser lens and a molten material and the focal distance of the condenser lens to a prescribed relation in spectroscopic analysis of an emission spectrum obtained by irradiating laser light to the molten material to be...

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Hauptverfasser: OOHASHI ZENJI, SUMIYAMA KOUZOU, TANIMOTO WATARU, ASAKAWA FUMIO, KIMURA SHIGEYUKI
Format: Patent
Sprache:eng
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Zusammenfassung:PURPOSE:To improve the analytical precision by setting the distance between a condenser lens and a molten material and the focal distance of the condenser lens to a prescribed relation in spectroscopic analysis of an emission spectrum obtained by irradiating laser light to the molten material to be measured in fluidized state. CONSTITUTION:The laser light emitted from a laser oscillator 1 is bent downward by a prism 2, and condensed at the surface of the molten material 4 to be measured in fluidized state by the condenser lens 3. The emission spectrum generated by the irradiation is introduced to a spectrometer 10 by a light introducing system consisting of a concave mirror 8, plane mirrors 9a, 9b. To prevent an intensity variation of the emission spectrum due to up-and-down movement of the material 4, the distance l between the lens 3 and the surface of the material 4 is regulated to 0.95f