SAMPLE AND METHOD FOR MEASURING YOUNG'S MODULUS OF FINE FILM

PURPOSE:To obtain the Young's modulus of a fine film accurately by chucking films with small width at specific intervals of length and measuring Young's moduli of the fine films. CONSTITUTION:The fine film which is =10 times the width. Those sample pieces are drawn by a stress- strain-temp...

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Hauptverfasser:	OOTA MITSURU, OKINO TAKAYUKI
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	PURPOSE:To obtain the Young's modulus of a fine film accurately by chucking films with small width at specific intervals of length and measuring Young's moduli of the fine films. CONSTITUTION:The fine film which is =10 times the width. Those sample pieces are drawn by a stress- strain-temperature tester and their Young's moduli are measured. When tensile tests of the sample pieces A, B, and C which are, for example, 0.27, 0.53, and 1.09mm. wide are taken with a 50g/mm. constant-speed load, an increase in sample length by >=10 times make their Young's moduli constant as shown by A