ABNORMALITY DETECTION CIRCUIT FOR SENSOR

PURPOSE:To enable accurate detection of the open condition of a sensor by connecting a signal generation means for cyclically generating two different level signals to a sensor output circuit through a high resistance to make a signal of the sensor output circuit when the sensor is opened different...

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Bibliographische Detailangaben
Hauptverfasser:	OGAWA TAKASHI, NAKANO JIROU
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	PURPOSE:To enable accurate detection of the open condition of a sensor by connecting a signal generation means for cyclically generating two different level signals to a sensor output circuit through a high resistance to make a signal of the sensor output circuit when the sensor is opened different from that in the normal condition of use. CONSTITUTION:A signal generation means (b) for cyclically generating two different level signals is connected to an output circuit 11 of a sensor 1 through a high resistance 212 and when the sensor 1 is opened, a signal different from that in the normal condition of use is generated in the circuit 11. This signal is compared with the output of the signal generation means (b) by a comparative detection means (a) to detect the opening of the sensor 1 due to the generation of a different signal accurately.