LEADING-IN SYSTEM FOR CIRCUIT TO BE TESTED

PURPOSE:To improve the economical properties for leading-in of a circuit to be tested by leading a single circuit into a tester after setting two circuits into a pair to make use of an idle contact and combining the actuation and restoration of a relay. CONSTITUTION:Outside lines LINE A and B are se...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: OKAMOTO YASUHIRO, KISHIKAWA YUUJI, SUKAI NOBUO, TAKAHASHI SHIYUNJI, UEHARA KAZUHIDE
Format: Patent
Sprache:eng
Schlagworte:
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