LEADING-IN SYSTEM FOR CIRCUIT TO BE TESTED

LEADING-IN SYSTEM FOR CIRCUIT TO BE TESTED

PURPOSE:To improve the economical properties for leading-in of a circuit to be tested by leading a single circuit into a tester after setting two circuits into a pair to make use of an idle contact and combining the actuation and restoration of a relay. CONSTITUTION:Outside lines LINE A and B are se...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: OKAMOTO YASUHIRO, KISHIKAWA YUUJI, SUKAI NOBUO, TAKAHASHI SHIYUNJI, UEHARA KAZUHIDE
Format: Patent
Sprache:eng
Schlagworte:
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRICITY
TELEPHONIC COMMUNICATION
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:PURPOSE:To improve the economical properties for leading-in of a circuit to be tested by leading a single circuit into a tester after setting two circuits into a pair to make use of an idle contact and combining the actuation and restoration of a relay. CONSTITUTION:Outside lines LINE A and B are set with LINE C and D into paires respectively, and two pairs of circuits can be connected to a tester TST via a relay contact st. Then LINE A and B or LINE C and D can be selected via a relay contact ch. Therefore in case subscribers SUB A and C are busy and a subscriber SUB B is not busy, both a subscriber SUB D and the LINE D can be connected to the tester TST by actuating relays st and ch.