PROCESSING CAPABILITY MEASURING DEVICE

PROCESSING CAPABILITY MEASURING DEVICE

PURPOSE:To obtain easily the throngh put of a microcomputer by calculating and displaying the through put at each prescribed period in an externally mounted device measuring the through put of an on-line system using a microcomputer. CONSTITUTION:An address collating circuit 3 references information...

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Hauptverfasser: ITOU MASAHIRO, SHIGENO KIYOFUMI, TSUKAMOTO NOBUAKI, KOIKE TAKAYASU
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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creator ITOU MASAHIRO
SHIGENO KIYOFUMI
TSUKAMOTO NOBUAKI
KOIKE TAKAYASU
description PURPOSE:To obtain easily the throngh put of a microcomputer by calculating and displaying the through put at each prescribed period in an externally mounted device measuring the through put of an on-line system using a microcomputer. CONSTITUTION:An address collating circuit 3 references information from a running address storage circuit 4 at idle time to collate whether or not the sampled address is within the address running at the predetermined idle time. Furthermore, whether and address is in idle state or in the state of program execution is discriminated and if the state is in the idle state, the running time is counted and the result of count is stored in a storage circuit 5. After a prescribed period is elapsed, a measuring period generating circuit 7 computes the through put of the microcomputer 1 by using the count value from a through put counter circuit 6 representing whether the state is in the idle state or in the state of program execution and displays the result on a display device 9.
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language eng
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subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
title PROCESSING CAPABILITY MEASURING DEVICE
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