PROCESSING CAPABILITY MEASURING DEVICE
PURPOSE:To obtain easily the throngh put of a microcomputer by calculating and displaying the through put at each prescribed period in an externally mounted device measuring the through put of an on-line system using a microcomputer. CONSTITUTION:An address collating circuit 3 references information...
Gespeichert in:
Hauptverfasser: | , , , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | PURPOSE:To obtain easily the throngh put of a microcomputer by calculating and displaying the through put at each prescribed period in an externally mounted device measuring the through put of an on-line system using a microcomputer. CONSTITUTION:An address collating circuit 3 references information from a running address storage circuit 4 at idle time to collate whether or not the sampled address is within the address running at the predetermined idle time. Furthermore, whether and address is in idle state or in the state of program execution is discriminated and if the state is in the idle state, the running time is counted and the result of count is stored in a storage circuit 5. After a prescribed period is elapsed, a measuring period generating circuit 7 computes the through put of the microcomputer 1 by using the count value from a through put counter circuit 6 representing whether the state is in the idle state or in the state of program execution and displays the result on a display device 9. |
---|