TESTING DEVICE USING SAMPLING UNIT OPERATED AT LOW TEMPERAT-URE

This test apparatus permist the testing of high speed semiconductor devices (room-temperature chips) by a Josephson junction sampling device (cryogenic chip) without intolerable loss of resolution. The interface comprises a quartz pass-through plug which includes a planar transmission line (5) inter...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	AASAA DABITSUDOSON, SADEGU MUSUTAAFUA FUARISU, JIYOOJI ANSONII SAIIHARASUZU, POORU ANDORIYUU MOSUKOUITSUTSU
Format:	Patent
Sprache:	eng
Schlagworte:	BLASTING ELECTRICITY FILLING VESSELS WITH, OR DISCHARGING FROM VESSELS, COMPRESSED,LIQUEFIED, OR SOLIDIFIED GASES FIXED-CAPACITY GAS-HOLDERS HEATING LIGHTING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES MECHANICAL ENGINEERING PHYSICS STORING OF DISTRIBUTING GASES OR LIQUIDS TESTING VESSELS FOR CONTAINING OR STORING COMPRESSED, LIQUEFIED ORSOLIDIFIED GASES WEAPONS
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