DISPLAYING METHOD FOR DEFECT POSITION
PURPOSE:To discriminate the repair defects while a printed substrate is held covered with a defect displaying sheet by opening windows corresponding to the defect positions of the patterns on the printed substrate in the defective position displaying sheet. CONSTITUTION:The laser beams from a laser...
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| creator | KURITA KATSUYUKI YAGI KAZUO MUTOU AKIFUMI |
| description | PURPOSE:To discriminate the repair defects while a printed substrate is held covered with a defect displaying sheet by opening windows corresponding to the defect positions of the patterns on the printed substrate in the defective position displaying sheet. CONSTITUTION:The laser beams from a laser 3 are condensed via a beam expander 4, a rotary mirror 5, and a lens 6 onto the pattern 2 on a printed substrate 1. The reflected light is made incident via a lens 6, the mirror 5, a half mirror 7 and a lens 8 to a photodetector 9. The output thereof is binary coded with a comparator 11 via an amplifier 10. The entire surface of the substrate 1 is scanned by the movement of an XY table. The video signal thereof is processed with a defect detecting circuit 12, and the addresses of defects are stored in a memory 13. A controller 14 reads the addresses of the defects, and opens windows to a defect displaying sheet 21 by operating a puncher 20. The sheet 21 is superposed on the substrate 1, whereby the defects are discriminated and repaired as they are. |
| format | Patent |
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CONSTITUTION:The laser beams from a laser 3 are condensed via a beam expander 4, a rotary mirror 5, and a lens 6 onto the pattern 2 on a printed substrate 1. The reflected light is made incident via a lens 6, the mirror 5, a half mirror 7 and a lens 8 to a photodetector 9. The output thereof is binary coded with a comparator 11 via an amplifier 10. The entire surface of the substrate 1 is scanned by the movement of an XY table. The video signal thereof is processed with a defect detecting circuit 12, and the addresses of defects are stored in a memory 13. A controller 14 reads the addresses of the defects, and opens windows to a defect displaying sheet 21 by operating a puncher 20. The sheet 21 is superposed on the substrate 1, whereby the defects are discriminated and repaired as they are.</description><language>eng</language><subject>APPARATUS SPECIALLY ADAPTED THEREFOR ; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS ; CINEMATOGRAPHY ; ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; ELECTROGRAPHY ; HOLOGRAPHY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS ; MATERIALS THEREFOR ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; ORIGINALS THEREFOR ; PHOTOGRAPHY ; PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES ; PHYSICS ; PRINTED CIRCUITS ; TESTING</subject><creationdate>1983</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19830402&DB=EPODOC&CC=JP&NR=S5855710A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19830402&DB=EPODOC&CC=JP&NR=S5855710A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KURITA KATSUYUKI</creatorcontrib><creatorcontrib>YAGI KAZUO</creatorcontrib><creatorcontrib>MUTOU AKIFUMI</creatorcontrib><title>DISPLAYING METHOD FOR DEFECT POSITION</title><description>PURPOSE:To discriminate the repair defects while a printed substrate is held covered with a defect displaying sheet by opening windows corresponding to the defect positions of the patterns on the printed substrate in the defective position displaying sheet. 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CONSTITUTION:The laser beams from a laser 3 are condensed via a beam expander 4, a rotary mirror 5, and a lens 6 onto the pattern 2 on a printed substrate 1. The reflected light is made incident via a lens 6, the mirror 5, a half mirror 7 and a lens 8 to a photodetector 9. The output thereof is binary coded with a comparator 11 via an amplifier 10. The entire surface of the substrate 1 is scanned by the movement of an XY table. The video signal thereof is processed with a defect detecting circuit 12, and the addresses of defects are stored in a memory 13. A controller 14 reads the addresses of the defects, and opens windows to a defect displaying sheet 21 by operating a puncher 20. The sheet 21 is superposed on the substrate 1, whereby the defects are discriminated and repaired as they are.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | APPARATUS SPECIALLY ADAPTED THEREFOR CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS CINEMATOGRAPHY ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY ELECTROGRAPHY HOLOGRAPHY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS MATERIALS THEREFOR MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ORIGINALS THEREFOR PHOTOGRAPHY PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES PHYSICS PRINTED CIRCUITS TESTING |
| title | DISPLAYING METHOD FOR DEFECT POSITION |
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