THICKNESS MEASURING DEVICE

PURPOSE:To measure the thickness based on the shape of an upper surfaces, by detecting a signal corresponding to the distance between specified sides of a material to be measured supporting on a table, by an image sensor provided so as to face the table. CONSTITUTION:Under the state the material to...

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1. Verfasser: FUKUDA NORISUKE
Format: Patent
Sprache:eng
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Zusammenfassung:PURPOSE:To measure the thickness based on the shape of an upper surfaces, by detecting a signal corresponding to the distance between specified sides of a material to be measured supporting on a table, by an image sensor provided so as to face the table. CONSTITUTION:Under the state the material to be measured P is set on the table 1, a starting command C is given to a controller 7. Then a lamp 5 is lit and the material P to be measured is irradiated by the light. The reflected light is inputted into the image sensor through a lens system 3. Based on the starting command Z from the controller 7, a sensor driving circuit 6 gives transfer pulses X to the image sensor 4, and electric charges are written into a resister part. Based on shift pulses Y from the driving circuit 6, output pulses F are outputted to a register part and counted by a counter 9 through a wave forming circuit 8. Since the material to be measured P has a constant width, the counted value is varied in correspondence with the thickness G of the material. A thickness converter 10 reads out the true thickness stored in an ROM, and displays the value on an display device 11.