METHOD FOR POSITION DETECTION

PURPOSE:To perform an accurate positioning of parts by a method wherein the bit row generating at every pad and lead is detected by scanning with a TV camera on the pad of a printed substrate and the lead of a part. CONSTITUTION:A printed substrate 10 is placed on a table 9, and the table is driven...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	OKADA NOBUHIDE, TAKESHITA SHIYUUJI
Format:	Patent
Sprache:	eng
Schlagworte:	APPARATUS SPECIALLY ADAPTED THEREFOR CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS CINEMATOGRAPHY CONTROLLING ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY ELECTROGRAPHY HOLOGRAPHY MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS MATERIALS THEREFOR MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ORIGINALS THEREFOR PHOTOGRAPHY PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES PHYSICS PRINTED CIRCUITS REGULATING SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	PURPOSE:To perform an accurate positioning of parts by a method wherein the bit row generating at every pad and lead is detected by scanning with a TV camera on the pad of a printed substrate and the lead of a part. CONSTITUTION:A printed substrate 10 is placed on a table 9, and the table is driven by a table motor 6 and a ball nut 8. The positions of the pad 11 of the substrate 10 and the lead 13 of the part 12 are detected by the TV cameras 1 and 2. The part supporting rod 18, with which the part 12 will be pinched, is driven by a head motor 3 and a ball nut 4. When the pad 11 and the lead 13 are moved, bit rows are obtained from the image sensors 16 and 17 of the cameras 1 and 2. The position of the part 12 can be detected accurately by computing the results of the comparison between the bit row and the master bit pattern.