DEVICE FOR TESTING CIRCUIT

PURPOSE:To reduce the inspection cost by effecting the parallel operation of a circuit to be tested and a given circuit in the standard circuit system of devices for testing circuits and by inspecting them with changed conditions of measurement.

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Bibliographische Detailangaben
1. Verfasser:	KATSUMI SHIGEKI
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	PURPOSE:To reduce the inspection cost by effecting the parallel operation of a circuit to be tested and a given circuit in the standard circuit system of devices for testing circuits and by inspecting them with changed conditions of measurement.