SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

PROBLEM TO BE SOLVED: To improve efficiency of test operation of a flash memory or the like provided with an internal voltage generating circuit and having a trimming function of each internal voltage. SOLUTION: A trimming data memory TROM consisting of non-volatile memories such as a flash memory or an EPROM is provided in a flash memory and like provided with an internal voltage generating circuit VG and having trimming functions of each internal voltage, a pseudo trimming data supplied from an external test device is taken in, and it is held. Consequently, by using a conventional device, independent trimming data are written individually in a trimming data memory TROM such as each flash memory and can be held even after disconnection of a power source, a test operation for confirming a function of the flash memory, etc., and acquiring a final trimming data, therefore, is performed simultaneously with plural and independent trimming data.