X-RAY SPECTRUM-ANALYZING DEVICE AND ITS AUTOMATIC QUANTITATIVE ANALYSIS METHOD

PROBLEM TO BE SOLVED: To provide an X-ray spectrum-analyzing device and its automatic quantitative analysis method for obtaining a quantitative analysis value with high reliability under optimum quantitative conditions. SOLUTION: When the file of spectrum data for matching is stored, each of the spe...

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1. Verfasser:	YURUGI TOSHIKAZU
Format:	Patent
Sprache:	eng
Schlagworte:	COLORIMETRY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide an X-ray spectrum-analyzing device and its automatic quantitative analysis method for obtaining a quantitative analysis value with high reliability under optimum quantitative conditions. SOLUTION: When the file of spectrum data for matching is stored, each of the spectrum data for matching is stored and set with the qualitative result by adding quantitative conditions. When quantity is determined, the spectrum data for matching approximating to the spectrum of a sample extremely is retrieved, composition and the quantitative conditions are called from the spectrum data for matching, thus performing a quantitative calculation.