FILM PROCESSING DEVICE

PROBLEM TO BE SOLVED: To reduce manufacturing cost by preventing such occurrence of travel with work in a process as resulting from the defect which has occurred in a process in the previous operation, for improved yield and manufacturing speed. SOLUTION: When a data read-out part 4 reads a data for...

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Bibliographische Detailangaben
1. Verfasser: NISHIZAWA YASUHIRO
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To reduce manufacturing cost by preventing such occurrence of travel with work in a process as resulting from the defect which has occurred in a process in the previous operation, for improved yield and manufacturing speed. SOLUTION: When a data read-out part 4 reads a data for defect which has occurred in the previous process out of an edge end part of an raw film roll 1, a control part 6 decides a work condition at a defect part, and around it, of the raw film roll 1 according to the content, degree, etc., of the defect, for controlling operation of a work part 5. When an inspection part 7 detects such defects as hole is opened on the raw film roll 1 or on the film formed on it, etc., by abnormal discharge, etc., in a process, the opened hole is enlarged, a film thickness is out of a tolerable range, etc., a recording part 8 records such defect data as corresponding to the content, degree, etc., of the defect detected by the inspection part 7 on the edge end of the raw film roll 1.