RELIABILITY TESTING METHOD OF CHIP RESISTOR

PROBLEM TO BE SOLVED: To provide a test method that can quickly evaluate and analyze the reliability of a chip resistor. SOLUTION: Power is applied to a chip resistor that is provided with a resistor on an insulation substrate, an electrode being provided at both the ends of the resistor, and an ins...

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1. Verfasser: ONO KIYOTAKA
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a test method that can quickly evaluate and analyze the reliability of a chip resistor. SOLUTION: Power is applied to a chip resistor that is provided with a resistor on an insulation substrate, an electrode being provided at both the ends of the resistor, and an insulating protection film for covering the resistor at a high temperature and a high humidity, and time when the change rate of a resistance value exceeds a fixed range is measured, thus coating electrolyte containing sodium chloride (NaCl) on the surface of the protection film and setting an application power smaller than a rated power in a test for evaluating the reliability of the resistor.