ELECTROMIGRATION EVALUATION CIRCUIT

PROBLEM TO BE SOLVED: To provide an electromigration evaluation circuit, capable of giving a current pulse of high frequency to an evaluated element with small distortion. SOLUTION: There are provided transistors 2, 3 for connecting respectively power sources 6, 7 to each end part of an evaluated el...

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1. Verfasser: OTSUJI YUICHI
Format: Patent
Sprache:eng
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