ELECTROMIGRATION EVALUATION CIRCUIT

PROBLEM TO BE SOLVED: To provide an electromigration evaluation circuit, capable of giving a current pulse of high frequency to an evaluated element with small distortion. SOLUTION: There are provided transistors 2, 3 for connecting respectively power sources 6, 7 to each end part of an evaluated el...

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1. Verfasser: OTSUJI YUICHI
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide an electromigration evaluation circuit, capable of giving a current pulse of high frequency to an evaluated element with small distortion. SOLUTION: There are provided transistors 2, 3 for connecting respectively power sources 6, 7 to each end part of an evaluated element 1 and transistors 4, 5 for connecting with grounding power sources 8, 9, and on/off switching of each transistor is performed by an output pulse from a pulse generator 10, whereby one of the respective end parts of the evaluated element 1 is alternately connected to the power source 6 or grounding power source 8. Then on the contrary, the other of the respective end parts is alternately connected to the grounding power source 9 or a power source 7.