INSPECTION METHOD FOR MAGNETIC HEAD AND INSPECTION DEVICE THEREFOR
PROBLEM TO BE SOLVED: To prevent an MR head inside a magnetic head assembly from being destroyed by static electricity when the terminal of the probe of a DCR measurement device is brought into contact with the measurement part of a lead at the time of measuring the characteristics of the magnetic h...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | PROBLEM TO BE SOLVED: To prevent an MR head inside a magnetic head assembly from being destroyed by static electricity when the terminal of the probe of a DCR measurement device is brought into contact with the measurement part of a lead at the time of measuring the characteristics of the magnetic head. SOLUTION: In this inspection method, a holder 18a formed by a semiconductor (surface resistance=1×10 -1×10 Ω/square) is connected to the ground G by closing a switch SW1, the terminal 9 and the DCR measurement device are interrupted by opening the switch SW2 and then, a magnetic head unit 1 and the lead 5 are mounted inside an installation part 12A. After the elapse of prescribed time, in the state of opening the switch SW1 and closing the switch SW2, the characteristics of the magnetic head unit 1 are measured. By performing disconnection by such as procedure, the MR head is prevented from being destroyed by the static electricity. |
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