METHOD AND DEVICE FOR MEASURING ELECTRONIC WAVE CHARACTERISTIC

PROBLEM TO BE SOLVED: To accurately measure such electronic wave characteristics as desired wave power and interference wave power simply with a simple operation, by providing a means for estimating the characteristics of the propagation path of electronic waves from a received and demodulated refer...

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1. Verfasser: AMAZAWA TAIJI
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To accurately measure such electronic wave characteristics as desired wave power and interference wave power simply with a simple operation, by providing a means for estimating the characteristics of the propagation path of electronic waves from a received and demodulated reference signal in a signal-processing system. SOLUTION: A measuring device 10 of electronic wave characteristics being applied to, for example, a CDMA-system portable telephone for performing space diversity synthesis is provided by holding, in common, the demodulation part of an audio signal/a pilot signal corresponding to each of signal-processing systems 11 and 12 of the telephone and propagation path estimation parts 14 and 21. The propagation path estimation part 14 obtains a propagation estimation value including information on a phase rotation and an envelope by the method of moving averages or the like for data being inputted successively, and obtains a received power SI of a desired wave based on the value. Interference wave power I1 is obtained based on a residue being obtained by subtracting the propagation path estimation value from a demodulation signal PD1 of a pilot signal, and a synthesized, desired wave power S, an interference wave power I, and their ratio SIR are obtained from the output of both processing systems 11 and 12.