MANAGEMENT OF PERIOD OF FACILITY PRECAUTION MAINTENANCE OF SEMICONDUCTOR MANUFACTURING FACILITITY MANAGEMENT SYSTEM

PROBLEM TO BE SOLVED: To provide a method for managing a period of facility precaution maintenance of a semiconductor manufacturing facility management system, which can prevent facility damage caused by worker's decision error for the period of precaution maintenance. SOLUTION: The method incl...

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Bibliographische Detailangaben
Hauptverfasser: SAI ZAISHO, JANG JAE-MAN, TEI SHUN
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a method for managing a period of facility precaution maintenance of a semiconductor manufacturing facility management system, which can prevent facility damage caused by worker's decision error for the period of precaution maintenance. SOLUTION: The method includes a step S10 of receiving operating parameter data from each facility, a step S20 of searching for a precaution maintenance period specification table, a step S30 of judging whether or not the value of the operating parameter data is not less than a specification data value in the precaution maintenance period specification table, a step S40 of changing a variable ID for a specific facility which issued the specific parameter data when the specific value in the operating parameter data values is not less than the specification data value, and a step S50 of carrying the variable ID in a facility control message and then downloading the facility control message in the specific facility to change the operating condition of the specific facility. As a result, quick precaution maintenance can be carried out in each facility at good timing without intervention of a worker.