DETERMINING METHOD OF ROAD SURFACE CONDITION AND IMPLEMENTATION APPARATUS THEREOF

PROBLEM TO BE SOLVED: To provide a method and an implementation apparatus thereof that can determine very accurately road surface condition, especially with respect to the existence of water, ice and/or snow, at relatively low price, independently of road coating. SOLUTION: In a determining method o...

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Bibliographische Detailangaben
1. Verfasser:	GRIESINGER MANFRED DR
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENT OF BRAKING ELEMENTS ON VEHICLES IN GENERAL BRAKE CONTROL SYSTEMS OR PARTS THEREOF, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS METEOROLOGY PERFORMING OPERATIONS PHYSICS PORTABLE DEVICES FOR PREVENTING UNWANTED MOVEMENT OFVEHICLES SIGNALLING TESTING TRAFFIC CONTROL SYSTEMS TRANSPORTING VEHICLE BRAKE CONTROL SYSTEMS OR PARTS THEREOF VEHICLE MODIFICATIONS TO FACILITATE COOLING OF BRAKES VEHICLES IN GENERAL
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a method and an implementation apparatus thereof that can determine very accurately road surface condition, especially with respect to the existence of water, ice and/or snow, at relatively low price, independently of road coating. SOLUTION: In a determining method of road surface condition, back-scattered light from road surface is decomposed to spectrum components and a change with respect to intensity of back-scattered light obtained thus is evaluated. Therefore, back-scattered spectrum with respect to a wavelength of a dried road surface is evaluated by mathematics function with free parameters, and the function is multiplied by an exponential function absorption term describing light-transmission of a water layer with a specified thickness. Then, a change of mathematics function with respect to a wavelength of intensity of back-scattered light, which impinges on a receiver 5, is obtained. Based upon actual measurement values, free parameters of function for an approximation as correct as possible is calculated, thereby obtains especially thickness of a water layer. An implementation apparatus thereof is a spectrometer, which uses an absorption device as a substitute for a dispersion device and is directly installed on a row of CCD 8.