INPUT/OUTPUT CIRCUIT FOR HIGH-SPEED SEMICONDUCTOR MEMORY AND HIGH-SPEED SEMICONDUCTOR MEMORY THEREFOR

PROBLEM TO BE SOLVED: To provide a high-speed semiconductor memory capable of shortening test time in a direct access test mode and testing the memory of the high-speed semiconductor memory even by using test equipment for not supporting multiplexing. SOLUTION: This memory is provided with a memory 211, many pads P0-P7, many input/output devices 221-228, many data buses B0-B3 and many multiplexers 241-248. The input/output devices are electrically connected to the pads respectively, the data buses are electrically connected to the pads respectively and the multiplexers are electrically connected to one of the respective input/output devices and the data buses. Data inputted fro the data but are written to the memory at the time of the direct access test mode for testing the memory and the data inputted from the input/output devices are written to the memory in a normal mode.