SEMICONDUCTOR MEMORY

PROBLEM TO BE SOLVED: To shorten the time required to gather information for judging whether a flash memory is acceptable or not. SOLUTION: This memory is provided with an X decoding means (12) provided with a normal operation mode for decoding an inputted X address and generating selecting signals for driving a pertinent work line to a selected level and a test mode for generating the selection signals for simultaneously driving the work lines to the selected level by the assertion of test signals. By simultaneously driving the word lines to the selected level by the assertion of the test signals, the number of memory cells writable by one write operation is increased and the time required for the screening is shortened.