HIGH FREQUENCY PROBE

PROBLEM TO BE SOLVED: To eliminate a change in a characteristic impedance due to a deflection by a contact pressurization, by ensuring a measurement of a device to be measured in the case that a signal electrode and a ground electrode of the device are not disposed in plane, dealing with a narrow pitch and multiple pins, simplicity of an end structure and durability. SOLUTION: A central conductive pattern 3 of the shape having a thin thickness equal to an electrode interval at the maximum in a lateral direction perpendicular to a longitudinal direction of a direction to be pressed against the electrode in such a manner that an end to be pressed against the electrode is covered with a metal cover 2 is fixed into a chip board sliding in the longitudinal direction in the cover 2. A central conductor 7 having an elasticity to connect an external connection connector 8 to the pattern 3 is fixed at its position by a space 6 in an internal space of a first metal block 5 for forming a coaxial circuit. In the case of being pressurized by contact of the end, a second metal block 4 disposed at the end side of a first metal block 5 can be deflected in the longitudinal direction in a long hole sufficiently long in the longitudinal direction at the center.