QUALITY INSPECTION DEVICE

PROBLEM TO BE SOLVED: To provide a quality inspection device wherein presence of defect is detected with an inspected surface stably lit with sure in high-temperature environment for no restoration on location in inspection. SOLUTION: A device comprises a lighting source 15 comprising a halogen lamp, etc. for projecting light at high temperature for lighting an inspected surface of an inspected object such as a sheet of paper 4, etc. in such high temperature environment as near an ink drying device 11, an imaging camera 16 for imaging the inspected surface lit with the light projected from the lighting source 15, and a judging means 17 for judging presence of a defect on the inspected surface based on the output from the imaging camera 16. Since the lighting source 15 projects light at high temperature, the inspected surface is stably lit with sure even in high temperature environment.